Digital Library
Search: "[ keyword: Testing ]" (55)
Test Suit Generation System for Retargetable C Compilers
Gyun Woo , Jung Ho Bae , Han Il Jang , Yun Jung Lee , Heung Seok Chae The KIPS Transactions:PartA,
Vol. 16, No. 4, pp. 245-254,
Aug.
2009
10.3745/KIPSTA.2009.16.4.245
10.3745/KIPSTA.2009.16.4.245
An Efficient kNN Algorithm
Jae Moon Lee The KIPS Transactions:PartB ,
Vol. 11, No. 7, pp. 849-854,
Dec.
2004
10.3745/KIPSTB.2004.11.7.849
10.3745/KIPSTB.2004.11.7.849
Code Coverage Measurement in Configurable Software Product Line Testing
Soobin Han, Jihyun Lee, Seoyeon Go KIPS Transactions on Software and Data Engineering,
Vol. 11, No. 7, pp. 273-282,
Jul.
2022
https://doi.org/10.3745/KTSDE.2022.11.7.273
Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage
https://doi.org/10.3745/KTSDE.2022.11.7.273
Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage
An Efficient Algorithm for NaiveBayes with Matrix Transposition
Lee Jae Mun The KIPS Transactions:PartB ,
Vol. 11, No. 1, pp. 117-124,
Feb.
2004
10.3745/KIPSTB.2004.11.1.117
10.3745/KIPSTB.2004.11.1.117
Deep Learning Model Validation Method Based on Image Data Feature Coverage
Chang-Nam Lim, Ye-Seul Park, Jung-Won Lee KIPS Transactions on Software and Data Engineering,
Vol. 10, No. 9, pp. 375-384,
Sep.
2021
https://doi.org/10.3745/KTSDE.2021.10.9.375
Keywords: Deep Learning, Coverage Testing, Image Feature Extraction, Validation Method, Dataset Splitting Method
https://doi.org/10.3745/KTSDE.2021.10.9.375
Keywords: Deep Learning, Coverage Testing, Image Feature Extraction, Validation Method, Dataset Splitting Method
Hybrid Statistical Learning Model for Intrusion Detection of Networks
Jeon Seong Hae The KIPS Transactions:PartC,
Vol. 10, No. 6, pp. 705-710,
Oct.
2003
10.3745/KIPSTC.2003.10.6.705
10.3745/KIPSTC.2003.10.6.705
An Improvement Of Efficiency For kNN By Using A Heuristic
Lee Jae Mun The KIPS Transactions:PartB ,
Vol. 10, No. 6, pp. 719-724,
Oct.
2003
10.3745/KIPSTB.2003.10.6.719
10.3745/KIPSTB.2003.10.6.719
MuGenFBD: Automated Mutant Generator for Function Block Diagram Programs
Lingjun Liu, Eunkyoung Jee, Doo-Hwan Bae KIPS Transactions on Software and Data Engineering,
Vol. 10, No. 4, pp. 115-124,
Apr.
2021
https://doi.org/10.3745/KTSDE.2021.10.4.115
Keywords: Mutant Generation, Mutation Analysis, Function Block Diagram, Software Testing
https://doi.org/10.3745/KTSDE.2021.10.4.115
Keywords: Mutant Generation, Mutation Analysis, Function Block Diagram, Software Testing
CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software
Hyerin Leem, Hansol Choe, Hyorim Kim, Shin Hong KIPS Transactions on Software and Data Engineering,
Vol. 9, No. 8, pp. 229-234,
Aug.
2020
https://doi.org/10.3745/KTSDE.2020.9.8.229
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
https://doi.org/10.3745/KTSDE.2020.9.8.229
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
A Test Case Generation Method for Data Distribution System of Submarine
Suik Son, Dongsu Kang KIPS Transactions on Software and Data Engineering,
Vol. 8, No. 4, pp. 137-144,
Apr.
2019
https://doi.org/10.3745/KTSDE.2019.8.4.137
Keywords: Data Distribution System, Model-based testing, Path Testing, Tree Traversal, test case generation
https://doi.org/10.3745/KTSDE.2019.8.4.137
Keywords: Data Distribution System, Model-based testing, Path Testing, Tree Traversal, test case generation