CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software
KIPS Transactions on Software and Data Engineering, Vol. 9, No. 8, pp. 229-234, Aug. 2020
https://doi.org/10.3745/KTSDE.2020.9.8.229, PDF Download:
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
Abstract
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Cite this article
[IEEE Style]
H. Leem, H. Choe, H. Kim, S. Hong, "CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software," KIPS Transactions on Software and Data Engineering, vol. 9, no. 8, pp. 229-234, 2020. DOI: https://doi.org/10.3745/KTSDE.2020.9.8.229.
[ACM Style]
Hyerin Leem, Hansol Choe, Hyorim Kim, and Shin Hong. 2020. CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software. KIPS Transactions on Software and Data Engineering, 9, 8, (2020), 229-234. DOI: https://doi.org/10.3745/KTSDE.2020.9.8.229.