CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software


KIPS Transactions on Software and Data Engineering, Vol. 9, No. 8, pp. 229-234, Aug. 2020
https://doi.org/10.3745/KTSDE.2020.9.8.229,   PDF Download:
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
Abstract

This paper presents the design and the implementation of CRESTIVE-DX, a concolic testing tool that distribute the concolic testing process over the embedded target system and the host system for efficient test generation of a target embedded program. CRESTIVE-DX conducts the execution of a target program on the target embedded system to consider possible machine-dependent behaviors of a target program execution, and conducts machine-independent parts, such as search-strategy heuristics, constraint solving, on host systems with high-speed computation unit, and coordinates their concurrent executions. CRESTIVE-DX is implemented by extending an existing concolic testing tool for C programs CREST. We conducted experiments with a test bed that consists of an embedded target system in the Arm Cortex A54 architecture and host systems in the x86-64 architecture. The results of experiments with Unix utility programs Grep, Busybox Awk, and Busybox Ed show that test input generation of CRESTIVE-DX is 1.59 to 2.64 times faster than that of CREST.


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Cite this article
[IEEE Style]
H. Leem, H. Choe, H. Kim, S. Hong, "CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software," KIPS Transactions on Software and Data Engineering, vol. 9, no. 8, pp. 229-234, 2020. DOI: https://doi.org/10.3745/KTSDE.2020.9.8.229.

[ACM Style]
Hyerin Leem, Hansol Choe, Hyorim Kim, and Shin Hong. 2020. CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software. KIPS Transactions on Software and Data Engineering, 9, 8, (2020), 229-234. DOI: https://doi.org/10.3745/KTSDE.2020.9.8.229.