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Search: "[ author: Yoon Sik Shin ]" (2)
LCD BLU Defects Detection System with Sidelight
Chang Bae Moon , Jee Woong Bark , Hae Yeoun Lee , Byeong Man Kim , Yoon Sik Shin The KIPS Transactions:PartB ,
Vol. 17, No. 6, pp. 445-458,
Dec.
2010
10.3745/KIPSTB.2010.17.6.445
10.3745/KIPSTB.2010.17.6.445
Korean Learning Assistant System with Automatically Extracted Knowledge
Gi Tae Park , Tae Hoon Lee , So Hyun Hwang , Byeong Man Kim , Hyun Ah Lee , Yoon Sik Shin KIPS Transactions on Software and Data Engineering,
Vol. 1, No. 2, pp. 91-102,
Nov.
2012
10.3745/KTSDE.2012.1.2.91
10.3745/KTSDE.2012.1.2.91
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Publications
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Vol. 13, 2024
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Vol. 12, 2023
- Vol. 12, No. 12 (Dec. 2023)
- Vol. 12, No. 11 (Nov. 2023)
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Vol. 11, 2022
- Vol. 11, No. 12 (Dec. 2022)
- Vol. 11, No. 11 (Nov. 2022)
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Vol. 10, 2021
- Vol. 10, No. 12 (Dec. 2021)
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Vol. 9, 2020
- Vol. 9, No. 12 (Dec. 2020)
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Vol. 8, 2019
- Vol. 8, No. 12 (Dec. 2019)
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Vol. 7, 2018
- Vol. 7, No. 12 (Dec. 2018)
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Vol. 6, 2017
- Vol. 6, No. 12 (Dec. 2017)
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Vol. 5, 2016
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Vol. 4, 2015
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Vol. 3, 2014
- Vol. 3, No. 12 (Dec. 2014)
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Vol. 2, 2013
- Vol. 2, No. 12 (Dec. 2013)
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Vol. 1, 2012
Old Journals
Indexing
All publications of KTSDE is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
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