LCD BLU Defects Detection System with Sidelight


The KIPS Transactions:PartB , Vol. 17, No. 6, pp. 445-458, Dec. 2010
10.3745/KIPSTB.2010.17.6.445,   PDF Download:

Abstract

A Cold Cathode Fluorescent Lamp(CCFL) is used as a LCD Monitor`s backlight widely. The most common way to check CCFL`s defects is an examination with the naked eye. This naked eye examination can cause examination inconsistencies and industrial disasters. A shooting environment and detection algorithms are important for finding CCFL. defects automatically. This paper presents CCFL defect detection algorithms using images captured under the shooting environment with sidelight which is one of the shooting environment we have suggested. The experimental result shows 4.65% of overdetection and 5.37% of unsuccessful defect detection of CCFL.


Statistics
Show / Hide Statistics

Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.


Cite this article
[IEEE Style]
C. B. Moon, J. W. Bark, H. Y. Lee, B. M. Kim, Y. S. Shin, "LCD BLU Defects Detection System with Sidelight," The KIPS Transactions:PartB , vol. 17, no. 6, pp. 445-458, 2010. DOI: 10.3745/KIPSTB.2010.17.6.445.

[ACM Style]
Chang Bae Moon, Jee Woong Bark, Hae Yeoun Lee, Byeong Man Kim, and Yoon Sik Shin. 2010. LCD BLU Defects Detection System with Sidelight. The KIPS Transactions:PartB , 17, 6, (2010), 445-458. DOI: 10.3745/KIPSTB.2010.17.6.445.