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    Bayesian Optimization Framework for Improved Cross-Version Defect Prediction
    Jeongwhan Choi, Duksan Ryu KIPS Transactions on Software and Data Engineering, Vol. 10, No. 9, pp. 339-348, Sep. 2021
    https://doi.org/10.3745/KTSDE.2021.10.9.339
    Keywords: Software Defect Prediction, Bayesian Optimization, Transfer Learning, Cross-Version Defect Prediction