Jeongwhan Choi, Duksan Ryu

KIPS Transactions on Software and Data Engineering, Vol. 10, No. 9, pp. 339-348, Sep. 2021
https://doi.org/10.3745/KTSDE.2021.10.9.339,   PDF Download:
Keywords: Software Defect Prediction, Bayesian Optimization, Transfer Learning, Cross-Version Defect Prediction
Abstract

In recent software defect prediction research, defect prediction between cross projects and cross-version projects are actively studied. Cross-version defect prediction studies assume WP(Within-Project) so far. However, in the CV(Cross-Version) environment, the previous work does not consider the distribution difference between project versions is important. In this study, we propose an automated Bayesian optimization framework that considers distribution differences between different versions. Through this, it automatically selects whether to perform transfer learning according to the difference in distribution. This framework is a technique that optimizes the distribution difference between versions, transfer learning, and hyper-parameters of the classifier. We confirmed that the method of automatically selecting whether to perform transfer learning based on the distribution difference is effective through experiments. Moreover, we can see that using our optimization framework is effective in improving performance and, as a result, can reduce software inspection effort. This is expected to support practical quality assurance activities for new version projects in a cross-version project environment

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