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Search: "[ keyword: test ]" (124)
    Extracting Reusable Test Cases from Modified MATLAB Simulink Model
    Park Geon Gu, Han Hye Jin, Chung Ki Hyun, Choi Kyung Hee KIPS Transactions on Software and Data Engineering, Vol. 8, No. 6, pp. 235-242, Jun. 2019
    https://doi.org/10.3745/KTSDE.2019.8.6.235
    Keywords: Test Case Reuse, Simulink/Stateflow, Model Based Test


    Shortest Path - Finding Algorithm using Multiple Dynamic - Range Queue ( MDRQ )
    Tae Jin Kim, Min Hong Han The KIPS Transactions:PartA, Vol. 8, No. 2, pp. 179-188, Jun. 2001
    10.3745/KIPSTA.2001.8.2.179


    Modular Exponentiation by m-Numeral System
    Sang Un Lee The KIPS Transactions:PartC, Vol. 18, No. 1, pp. 1-6, Feb. 2011
    10.3745/KIPSTC.2011.18.1.1


    A Method of Statistical Randomness Test for Key Derivation Functions
    Ju Sung Kang , Ok Yeon Yi , Ji Sun Youm , Jin Woong Cho The KIPS Transactions:PartC, Vol. 17, No. 1, pp. 47-60, Feb. 2010
    10.3745/KIPSTC.2010.17.1.47


    Development Testing/Evaluating Methods about Security Functions based on Digital Printer
    Young Jun Cho , Kwang Woo Lee , Sung Kyu Cho , Hyun Sang Park , Hyoung Seob Lee , Hyun Seung Lee , Song Yi Kim , Wook Jae Cha , Woong Ryul Jeon , Dong Ho Won , Seung Joo The KIPS Transactions:PartC, Vol. 16, No. 4, pp. 461-476, Aug. 2009
    10.3745/KIPSTC.2009.16.4.461


    Mutual Attestation Protocol using Software-based Attestation Scheme in Sensor Network Environments
    Kyung Soo Heo , Hyun Woo Choi , Hyun Su Jang , Young Ik Eom The KIPS Transactions:PartC, Vol. 15, No. 1, pp. 9-18, Feb. 2008
    10.3745/KIPSTC.2008.15.1.9


    Secret Information Protection Scheme for Device in Home Network
    Young Jae Maeng , Jeon Il Kang , Abedelaziz Mohaisen , Dae Hun Nyang , Kyung Hee Lee The KIPS Transactions:PartC, Vol. 14, No. 4, pp. 341-348, Aug. 2007
    10.3745/KIPSTC.2007.14.4.341


    A Study of Enhanced Test Maturity Model with Test Process Improvement
    Ki Du Kim , Young Chul Kim The KIPS Transactions:PartD, Vol. 14, No. 1, pp. 57-66, Feb. 2007
    10.3745/KIPSTD.2007.14.1.57


    Design and Application of the TFM Based System Test Model for the Weapon System Embedded Software
    Jae Hwan Kim , Hee Byung Yoon The KIPS Transactions:PartD, Vol. 13, No. 7, pp. 923-930, Dec. 2006
    10.3745/KIPSTD.2006.13.7.923


    Reengineering Black-box Test Cases
    Kwang Ik Seo , Eun Man Choi The KIPS Transactions:PartD, Vol. 13, No. 4, pp. 573-582, Aug. 2006
    10.3745/KIPSTD.2006.13.4.573


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