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Search: "[ keyword: test ]" (124)
    Conformance Test Scenario Extraction Techniques for Embedded Software using Test Execution Time
    In Su Park , Young Sul Shin , Sung Ho Ahn , Jin Sam Kim , Jae Young Kim , Woo Jin Lee The KIPS Transactions:PartD, Vol. 17, No. 2, pp. 147-156, Apr. 2010
    10.3745/KIPSTD.2010.17.2.147


    Automatic Test Case Generation Through 1-to-1 Requirement Modeling
    Jung Sup Oh , Kyung Hee Choi , Gi Hyun Jung The KIPS Transactions:PartD, Vol. 17, No. 1, pp. 41-52, Feb. 2010
    10.3745/KIPSTD.2010.17.1.41


    An Efficient Searching of Vulnerabilities based on a DNS System model using Ptolemy
    Seung Hun Shin , Seung Kyu Park , Ki Hyun Jung The KIPS Transactions:PartD, Vol. 16, No. 6, pp. 921-926, Dec. 2009
    10.3745/KIPSTD.2009.16.6.921


    Automated Black-Box Test Case Generation for MC/DC with SAT
    In Sang Chung The KIPS Transactions:PartD, Vol. 16, No. 6, pp. 911-920, Dec. 2009
    10.3745/KIPSTD.2009.16.6.911


    A Method of Test Case Generation using BPMN-based Model Reduction for Service System
    Seung Hoon Lee , Dong Su Kang , Chee Yang Song , Doo Kwon Baik The KIPS Transactions:PartD, Vol. 16, No. 4, pp. 595-612, Aug. 2009
    10.3745/KIPSTD.2009.16.4.595


    Comparison of Test Case Effectiveness Based on Dynamic Diagrams Using Mutation Testing
    Hyuck Su Lee , Choi Eun Man The KIPS Transactions:PartD, Vol. 16, No. 4, pp. 517-526, Aug. 2009
    10.3745/KIPSTD.2009.16.4.517


    Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT
    In Sang Chung The KIPS Transactions:PartD, Vol. 16, No. 3, pp. 371-380, Jun. 2009
    10.3745/KIPSTD.2009.16.3.371


    Test Supporter for GUI of Mobile Application Software in J2ME Platform
    Sun Myumg Hwang The KIPS Transactions:PartD, Vol. 16, No. 3, pp. 361-370, Jun. 2009
    10.3745/KIPSTD.2009.16.3.361


    Traceability of UML Based Test Artifacts Using XML
    Kwang Ik Seo , Eun Man Choi The KIPS Transactions:PartD, Vol. 16, No. 2, pp. 213-222, Apr. 2009
    10.3745/KIPSTD.2009.16.2.213


    An On-The-Fly Testing Technique of Embedded Software using Aspect Components
    Jong Phil Kim , Jang Eui Hong The KIPS Transactions:PartD, Vol. 15, No. 6, pp. 785-792, Dec. 2008
    10.3745/KIPSTD.2008.15.6.785


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