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A Code Clustering Technique for Unifying Method Full Path of Reusable Cloned Code Sets of a Product Family
Kim Taeyoung, Lee Jihyun, Kim Eunmi KIPS Transactions on Software and Data Engineering,
Vol. 12, No. 1, pp. 1-18,
Jan.
2023
https://doi.org/10.3745/KTSDE.2023.12.1.1
Keywords: Clone-and-own Approach, Software Product Line Migration, Product Line Code Base, Code Clustering
https://doi.org/10.3745/KTSDE.2023.12.1.1
Keywords: Clone-and-own Approach, Software Product Line Migration, Product Line Code Base, Code Clustering
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KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).