An Automatic Test Case Generation Method from Checklist


KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 401-410, Aug. 2017
10.3745/KTSDE.2017.6.8.401,   PDF Download:
Keywords: Embedded System, Test Case, Medical Device, Checklist, Testing
Abstract

This paper proposes a method to generate test cases in an automatic manner, based on checklist containing test cases used for testing embedded systems. In general, the items to be tested are defined in a checklist. However, most test case generation strategies recommend to test a system with not only the defined test items but also various mutated test conditions. The proposed method parses checklist in Korean file and figures out the system inputs and outputs, and operation information. With the found information and the user defined test case generation strategy, the test cases are automatically generated. With the proposed method, the errors introduced during manual test case generation may be reduced and various test cases not defined in checklist can be generated. The proposed method is implemented and the experiment is performed with the checklist for an medical embedded system. The feasibility of the proposed method is shown through the test cases generated from the checklist. The test cases are adequate to the coverages and their statistics are correct.


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Cite this article
[IEEE Style]
H. D. Kim, D. J. Kim, K. H. Chung, K. H. Choi, H. J. Park, Y. Y. Lee, "An Automatic Test Case Generation Method from Checklist," KIPS Transactions on Software and Data Engineering, vol. 6, no. 8, pp. 401-410, 2017. DOI: 10.3745/KTSDE.2017.6.8.401.

[ACM Style]
Hyun Dong Kim, Dae Joon Kim, Ki Hyun Chung, Kyung Hee Choi, Ho Joon Park, and Yong Yoon Lee. 2017. An Automatic Test Case Generation Method from Checklist. KIPS Transactions on Software and Data Engineering, 6, 8, (2017), 401-410. DOI: 10.3745/KTSDE.2017.6.8.401.