An Automatic Test Case Generation Method from Checklist
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 401-410, Aug. 2017
10.3745/KTSDE.2017.6.8.401, PDF Download:
Keywords: Embedded System, Test Case, Medical Device, Checklist, Testing
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Cite this article
[IEEE Style]
H. D. Kim, D. J. Kim, K. H. Chung, K. H. Choi, H. J. Park, Y. Y. Lee, "An Automatic Test Case Generation Method from Checklist," KIPS Transactions on Software and Data Engineering, vol. 6, no. 8, pp. 401-410, 2017. DOI: 10.3745/KTSDE.2017.6.8.401.
[ACM Style]
Hyun Dong Kim, Dae Joon Kim, Ki Hyun Chung, Kyung Hee Choi, Ho Joon Park, and Yong Yoon Lee. 2017. An Automatic Test Case Generation Method from Checklist. KIPS Transactions on Software and Data Engineering, 6, 8, (2017), 401-410. DOI: 10.3745/KTSDE.2017.6.8.401.