Subject Test Using Electroencephalogram According to Variation of Autostereoscopic Image Quality
KIPS Transactions on Software and Data Engineering, Vol. 5, No. 4, pp. 195-202, Apr. 2016
10.3745/KTSDE.2016.5.4.195, PDF Download:
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Cite this article
[IEEE Style]
J. Moon, J. Hong, Y. Choi, J. Suh, "Subject Test Using Electroencephalogram According to Variation of Autostereoscopic Image Quality," KIPS Transactions on Software and Data Engineering, vol. 5, no. 4, pp. 195-202, 2016. DOI: 10.3745/KTSDE.2016.5.4.195.
[ACM Style]
Jae-Chul Moon, Jong-Ui Hong, Yoo-Joo Choi, and Jung-Keun Suh. 2016. Subject Test Using Electroencephalogram According to Variation of Autostereoscopic Image Quality. KIPS Transactions on Software and Data Engineering, 5, 4, (2016), 195-202. DOI: 10.3745/KTSDE.2016.5.4.195.