Study for Design of Defect Management to Improve the Quality of IoT Products
KIPS Transactions on Software and Data Engineering, Vol. 11, No. 6, pp. 229-236, Jun. 2022
https://doi.org/10.3745/KTSDE.2022.11.6.229, PDF Download:
Keywords: IoT, fire detection, Defect Management, Factor Analysis, Defect Tracking
Abstract
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Cite this article
[IEEE Style]
K. J. Gyeong, C. Y. Sook, C. K. Rok, L. E. Ser, "Study for Design of Defect Management to Improve
the Quality of IoT Products," KIPS Transactions on Software and Data Engineering, vol. 11, no. 6, pp. 229-236, 2022. DOI: https://doi.org/10.3745/KTSDE.2022.11.6.229.
[ACM Style]
Kim Jae Gyeong, Choi Yeong Sook, Cho Kyeong Rok, and Lee Eun Ser. 2022. Study for Design of Defect Management to Improve
the Quality of IoT Products. KIPS Transactions on Software and Data Engineering, 11, 6, (2022), 229-236. DOI: https://doi.org/10.3745/KTSDE.2022.11.6.229.