A Test Case Generation Techniques Based on J2ME Platform
The KIPS Transactions:PartD, Vol. 13, No. 2, pp. 215-222, Apr. 2006
10.3745/KIPSTD.2006.13.2.215, PDF Download:
Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
S. I. Kim, M. K. Roh, S. Y. Rhew, "A Test Case Generation Techniques Based on J2ME Platform," The KIPS Transactions:PartD, vol. 13, no. 2, pp. 215-222, 2006. DOI: 10.3745/KIPSTD.2006.13.2.215.
[ACM Style]
Sang Il Kim, Myong Ki Roh, and Sung Yul Rhew. 2006. A Test Case Generation Techniques Based on J2ME Platform. The KIPS Transactions:PartD, 13, 2, (2006), 215-222. DOI: 10.3745/KIPSTD.2006.13.2.215.