A Measurement Algorithm using Gray-level Thresholding in Automatic Refracto-Keratometer
The KIPS Transactions:PartB , Vol. 9, No. 6, pp. 727-734, Dec. 2002
10.3745/KIPSTB.2002.9.6.727, PDF Download:
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Cite this article
[IEEE Style]
W. Seong and J. W. Park, "A Measurement Algorithm using Gray-level Thresholding in Automatic Refracto-Keratometer," The KIPS Transactions:PartB , vol. 9, no. 6, pp. 727-734, 2002. DOI: 10.3745/KIPSTB.2002.9.6.727.
[ACM Style]
Won Seong and Jong Won Park. 2002. A Measurement Algorithm using Gray-level Thresholding in Automatic Refracto-Keratometer. The KIPS Transactions:PartB , 9, 6, (2002), 727-734. DOI: 10.3745/KIPSTB.2002.9.6.727.