An Architecture for Managing Faulty Sensing Data on Low Cost Sensing Devices over Manufacturing Equipments
KIPS Transactions on Software and Data Engineering, Vol. 7, No. 3, pp. 113-120, Mar. 2018
10.3745/KTSDE.2018.7.3.113, PDF Download:
Keywords: Manufacturing Equipment, Monitoring, Unstructured Data, Faulty Signal
Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
Y. Chae, C. Kim, H. Ko, W. Kim, "An Architecture for Managing Faulty Sensing Data on Low Cost Sensing Devices over Manufacturing Equipments," KIPS Transactions on Software and Data Engineering, vol. 7, no. 3, pp. 113-120, 2018. DOI: 10.3745/KTSDE.2018.7.3.113.
[ACM Style]
Yuna Chae, Changi Kim, Haram Ko, and Woongsup Kim. 2018. An Architecture for Managing Faulty Sensing Data on Low Cost Sensing Devices over Manufacturing Equipments. KIPS Transactions on Software and Data Engineering, 7, 3, (2018), 113-120. DOI: 10.3745/KTSDE.2018.7.3.113.