An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment


The KIPS Transactions:PartD, Vol. 9, No. 4, pp. 659-666, Aug. 2002
10.3745/KIPSTD.2002.9.4.659,   PDF Download:

Abstract

Park, Seo and Kim [12] developed the input domain-based SRGM, which was able to quantitatively assess the reliability of a software system during the testing and operational phases. They assumed perfect debugging during testing and debugging phase. To make this input domain-based SRGM more realistic, this assumption should be relaxed. In this paper we generalize the input domain-based SRGM under imperfect debugging. Then its statistical characteristics are investigated.


Statistics
Show / Hide Statistics

Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.


Cite this article
[IEEE Style]
J. Y. Park, Y. S. Kim, Y. S. Hwang, "An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment," The KIPS Transactions:PartD, vol. 9, no. 4, pp. 659-666, 2002. DOI: 10.3745/KIPSTD.2002.9.4.659.

[ACM Style]
Joong Yang Park, Young Soon Kim, and Yang Sook Hwang. 2002. An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment. The KIPS Transactions:PartD, 9, 4, (2002), 659-666. DOI: 10.3745/KIPSTD.2002.9.4.659.