Digital Library
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, Aug. 2017
The Assessment Guideline of the Simplified Test Maturity Model (TMM) for An Assessor
Woo Sung Jang, Ki Du Kim, Hyun Seung Son, Bo Kyung Park, R. Young Chul Kim
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 379-384, Aug. 2017
10.3745/KTSDE.2017.6.8.379
Keywords: Test Maturity Model (TMM), Test Assessment Guide, The Simplified Test Maturity Model
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 379-384, Aug. 2017
10.3745/KTSDE.2017.6.8.379
Keywords: Test Maturity Model (TMM), Test Assessment Guide, The Simplified Test Maturity Model
Model-Based Automatic Test Data Generation Method Using Custom Parser and SMT Solver
Ki-Wook Shin, Dong-Jin Lim
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 385-390, Aug. 2017
10.3745/KTSDE.2017.6.8.385
Keywords: test case generation, Model-Based Development, Custom Parser, SMT Solver
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 385-390, Aug. 2017
10.3745/KTSDE.2017.6.8.385
Keywords: test case generation, Model-Based Development, Custom Parser, SMT Solver
Practical Software Architecture Design Methods for Non-Conventional Quality Requirements
Hyun Jung La, Soo Dong Kim
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 391-400, Aug. 2017
10.3745/KTSDE.2017.6.8.391
Keywords: Software Architecture, Non-Functional Requirement, Architectural Tactic, Design Process, Traceability-Based Evaluation
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 391-400, Aug. 2017
10.3745/KTSDE.2017.6.8.391
Keywords: Software Architecture, Non-Functional Requirement, Architectural Tactic, Design Process, Traceability-Based Evaluation
An Automatic Test Case Generation Method from Checklist
Hyun Dong Kim, Dae Joon Kim, Ki Hyun Chung, Kyung Hee Choi, Ho Joon Park, Yong Yoon Lee
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 401-410, Aug. 2017
10.3745/KTSDE.2017.6.8.401
Keywords: Embedded System, Test Case, Medical Device, Checklist, Testing
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 401-410, Aug. 2017
10.3745/KTSDE.2017.6.8.401
Keywords: Embedded System, Test Case, Medical Device, Checklist, Testing
Analysis of High School Informatics Curriculum Based on Computer Science Curricula 2013
HoSung Woo, JaMee Kim, WonGyu Lee
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 411-418, Aug. 2017
10.3745/KTSDE.2017.6.8.411
Keywords: Higher Informatics Curriculum, Curriculum, High school Informatics Curriculum
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 411-418, Aug. 2017
10.3745/KTSDE.2017.6.8.411
Keywords: Higher Informatics Curriculum, Curriculum, High school Informatics Curriculum