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CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software
Hyerin Leem, Hansol Choe, Hyorim Kim, Shin Hong KIPS Transactions on Software and Data Engineering,
Vol. 9, No. 8, pp. 229-234,
Aug.
2020
https://doi.org/10.3745/KTSDE.2020.9.8.229
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
https://doi.org/10.3745/KTSDE.2020.9.8.229
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
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