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A Study on Extraction of Additional Information Methodology for Defect Management in the Design Stage
Lee Eun-Ser KIPS Transactions on Software and Data Engineering,
Vol. 9, No. 10, pp. 297-302,
Oct.
2020
https://doi.org/10.3745/KTSDE.2020.9.10.297
Keywords: Defect Management, Quality of Design, Design of Critical Items
https://doi.org/10.3745/KTSDE.2020.9.10.297
Keywords: Defect Management, Quality of Design, Design of Critical Items
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