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Predicting Defect-Prone Software Module Using GA-SVM
Young Ok Kim , Ki Tae Kwon KIPS Transactions on Software and Data Engineering,
Vol. 2, No. 1, pp. 1-6,
Jan.
2013
10.3745/KTSDE.2013.2.1.1
10.3745/KTSDE.2013.2.1.1
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Vol. 1, 2012
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