Digital Library
Search: "[ keyword: Defect ]" (24)
A Study of Analysis of Attribute and Operation based on COTS System
Eun Ser Lee , Joong Soo Kim The KIPS Transactions:PartD,
Vol. 17, No. 6, pp. 443-452,
Dec.
2010
10.3745/KIPSTD.2010.17.6.443
10.3745/KIPSTD.2010.17.6.443
LCD BLU Defects Detection System with Sidelight
Chang Bae Moon , Jee Woong Bark , Hae Yeoun Lee , Byeong Man Kim , Yoon Sik Shin The KIPS Transactions:PartB ,
Vol. 17, No. 6, pp. 445-458,
Dec.
2010
10.3745/KIPSTB.2010.17.6.445
10.3745/KIPSTB.2010.17.6.445
Defect Detection and Defect Classification System for Ship Engine using Multi-Channel Vibration Sensor
Yang Min Lee , Kwang Young Lee , Seung Hyun Bae , Hwi Jang , Jae Kee Lee The KIPS Transactions:PartA,
Vol. 17, No. 2, pp. 81-92,
Apr.
2010
10.3745/KIPSTA.2010.17.2.81
10.3745/KIPSTA.2010.17.2.81
An Experimental Study of Generality of Software Defects Prediction Models based on Object Oriented Metrics
Tae Yeon Kim , Yun Kyu Kim , Heung Seok Chae The KIPS Transactions:PartD,
Vol. 16, No. 3, pp. 407-416,
Jun.
2009
10.3745/KIPSTD.2009.16.3.407
10.3745/KIPSTD.2009.16.3.407
A Study of Process Milestone for the Analysis of Risk Items
Eun Ser Lee The KIPS Transactions:PartD,
Vol. 16, No. 1, pp. 105-112,
Feb.
2009
10.3745/KIPSTD.2009.16.1.105
10.3745/KIPSTD.2009.16.1.105
A Study on Software Fault Analysis and Management Method using Defect Tracking System
Young Joon Moon , Sung Yul Rhew The KIPS Transactions:PartD,
Vol. 15, No. 3, pp. 321-326,
Jun.
2008
10.3745/KIPSTD.2008.15.3.321
10.3745/KIPSTD.2008.15.3.321
An Evaluation of Software Quality Using Phase-based Defect Profile
Sang Un Lee The KIPS Transactions:PartD,
Vol. 15, No. 3, pp. 313-320,
Jun.
2008
10.3745/KIPSTD.2008.15.3.313
10.3745/KIPSTD.2008.15.3.313
Software Defect Prediction Based on SAINT
Sriman Mohapatra, Eunjeong Ju, Jeonghwa Lee, Duksan Ryu The Transactions of the Korea Information Processing Society,
Vol. 13, No. 5, pp. 236-242,
May.
2024
https://doi.org/10.3745/TKIPS.2024.13.5.236
Keywords: Transformer, SAINT, Software Defect Prediction
https://doi.org/10.3745/TKIPS.2024.13.5.236
Keywords: Transformer, SAINT, Software Defect Prediction
Study for Design of Defect Management to Improve the Quality of IoT Products
Kim Jae Gyeong, Choi Yeong Sook, Cho Kyeong Rok, Lee Eun Ser KIPS Transactions on Software and Data Engineering,
Vol. 11, No. 6, pp. 229-236,
Jun.
2022
https://doi.org/10.3745/KTSDE.2022.11.6.229
Keywords: IoT, fire detection, Defect Management, Factor Analysis, Defect Tracking
https://doi.org/10.3745/KTSDE.2022.11.6.229
Keywords: IoT, fire detection, Defect Management, Factor Analysis, Defect Tracking
A Study on Tire Surface Defect Detection Method Using Depth Image
Hyun Suk Kim, Dong Beom Ko, Won Gok Lee, You Suk Bae KIPS Transactions on Software and Data Engineering,
Vol. 11, No. 5, pp. 211-220,
May.
2022
https://doi.org/10.3745/KTSDE.2022.11.5.211
Keywords: Tire Defect Detection, Depth Image, Deep Learning, computer vision, image processing
https://doi.org/10.3745/KTSDE.2022.11.5.211
Keywords: Tire Defect Detection, Depth Image, Deep Learning, computer vision, image processing