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Model-Based Automatic Test Data Generation Method Using Custom Parser and SMT Solver
Ki-Wook Shin, Dong-Jin Lim KIPS Transactions on Software and Data Engineering,
Vol. 6, No. 8, pp. 385-390,
Aug.
2017
10.3745/KTSDE.2017.6.8.385
Keywords: test case generation, Model-Based Development, Custom Parser, SMT Solver
10.3745/KTSDE.2017.6.8.385
Keywords: test case generation, Model-Based Development, Custom Parser, SMT Solver
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