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Image-Based Application Testing Method Using Faster D2-Net for Identification of the Same Image
Chun Hye-Won, Jo Min-Seok, Han Sung-Soo, Jeong Chang-Sung KIPS Transactions on Software and Data Engineering,
Vol. 11, No. 2, pp. 87-92,
Feb.
2022
https://doi.org/10.3745/KTSDE.2022.11.2.87
Keywords: Application Test, Deep Learning, Image matching, Feature matching, Image Compare
https://doi.org/10.3745/KTSDE.2022.11.2.87
Keywords: Application Test, Deep Learning, Image matching, Feature matching, Image Compare
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