Model-Based Automatic Test Data Generation Method Using Custom Parser and SMT Solver
KIPS Transactions on Software and Data Engineering, Vol. 6, No. 8, pp. 385-390, Aug. 2017
10.3745/KTSDE.2017.6.8.385, PDF Download:
Keywords: test case generation, Model-Based Development, Custom Parser, SMT Solver
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Cite this article
[IEEE Style]
K. Shin and D. Lim, "Model-Based Automatic Test Data Generation Method Using Custom Parser and SMT Solver," KIPS Transactions on Software and Data Engineering, vol. 6, no. 8, pp. 385-390, 2017. DOI: 10.3745/KTSDE.2017.6.8.385.
[ACM Style]
Ki-Wook Shin and Dong-Jin Lim. 2017. Model-Based Automatic Test Data Generation Method Using Custom Parser and SMT Solver. KIPS Transactions on Software and Data Engineering, 6, 8, (2017), 385-390. DOI: 10.3745/KTSDE.2017.6.8.385.