Image-Based Application Testing Method Using Faster D2-Net for Identification of the Same Image
KIPS Transactions on Software and Data Engineering, Vol. 11, No. 2, pp. 87-92, Feb. 2022
https://doi.org/10.3745/KTSDE.2022.11.2.87, PDF Download:
Keywords: Application Test, Deep Learning, Image matching, Feature matching, Image Compare
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Cite this article
[IEEE Style]
C. Hye-Won, J. Min-Seok, H. Sung-Soo, J. Chang-Sung, "Image-Based Application Testing Method Using Faster D2-Net
for Identification of the Same Image," KIPS Transactions on Software and Data Engineering, vol. 11, no. 2, pp. 87-92, 2022. DOI: https://doi.org/10.3745/KTSDE.2022.11.2.87.
[ACM Style]
Chun Hye-Won, Jo Min-Seok, Han Sung-Soo, and Jeong Chang-Sung. 2022. Image-Based Application Testing Method Using Faster D2-Net
for Identification of the Same Image. KIPS Transactions on Software and Data Engineering, 11, 2, (2022), 87-92. DOI: https://doi.org/10.3745/KTSDE.2022.11.2.87.