A Study on Extraction of Additional Information Methodology for Defect Management in the Design Stage
KIPS Transactions on Software and Data Engineering, Vol. 9, No. 10, pp. 297-302, Oct. 2020
https://doi.org/10.3745/KTSDE.2020.9.10.297, PDF Download:
Keywords: Defect Management, Quality of Design, Design of Critical Items
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Cite this article
[IEEE Style]
L. Eun-Ser, "A Study on Extraction of Additional Information Methodology for Defect Management in the Design Stage," KIPS Transactions on Software and Data Engineering, vol. 9, no. 10, pp. 297-302, 2020. DOI: https://doi.org/10.3745/KTSDE.2020.9.10.297.
[ACM Style]
Lee Eun-Ser. 2020. A Study on Extraction of Additional Information Methodology for Defect Management in the Design Stage. KIPS Transactions on Software and Data Engineering, 9, 10, (2020), 297-302. DOI: https://doi.org/10.3745/KTSDE.2020.9.10.297.