Study for Level of Portability to Quality Improvement of Embedded Software


KIPS Transactions on Software and Data Engineering, Vol. 7, No. 10, pp. 383-386, Oct. 2018
10.3745/KTSDE.2018.7.10.383,   PDF Download:
Keywords: Software Quality, Level of Reliability, Evaluation of Portability, Estimation of Software Quality
Abstract

As the importance of software has been recognized, the impact of embedded software quality on product quality has become increasingly important. Therefore, in this study, reliability is extracted according to the embedded characteristics and it is described that the reliability evaluation of the embedded software is made easier.


Statistics
Show / Hide Statistics

Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.


Cite this article
[IEEE Style]
E. S. Lee, "Study for Level of Portability to Quality Improvement of Embedded Software," KIPS Transactions on Software and Data Engineering, vol. 7, no. 10, pp. 383-386, 2018. DOI: 10.3745/KTSDE.2018.7.10.383.

[ACM Style]
Eun Ser Lee. 2018. Study for Level of Portability to Quality Improvement of Embedded Software. KIPS Transactions on Software and Data Engineering, 7, 10, (2018), 383-386. DOI: 10.3745/KTSDE.2018.7.10.383.