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Search: "[ keyword: Testing ]" (54)
    Test Suit Generation System for Retargetable C Compilers
    Gyun Woo , Jung Ho Bae , Han Il Jang , Yun Jung Lee , Heung Seok Chae The KIPS Transactions:PartA, Vol. 16, No. 4, pp. 245-254, Aug. 2009
    10.3745/KIPSTA.2009.16.4.245


    An Efficient kNN Algorithm
    Jae Moon Lee The KIPS Transactions:PartB , Vol. 11, No. 7, pp. 849-854, Dec. 2004
    10.3745/KIPSTB.2004.11.7.849


    Code Coverage Measurement in Configurable Software Product Line Testing
    Soobin Han, Jihyun Lee, Seoyeon Go KIPS Transactions on Software and Data Engineering, Vol. 11, No. 7, pp. 273-282, Jul. 2022
    https://doi.org/10.3745/KTSDE.2022.11.7.273
    Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage


    An Efficient Algorithm for NaiveBayes with Matrix Transposition
    Lee Jae Mun The KIPS Transactions:PartB , Vol. 11, No. 1, pp. 117-124, Feb. 2004
    10.3745/KIPSTB.2004.11.1.117


    Deep Learning Model Validation Method Based on Image Data Feature Coverage
    Chang-Nam Lim, Ye-Seul Park, Jung-Won Lee KIPS Transactions on Software and Data Engineering, Vol. 10, No. 9, pp. 375-384, Sep. 2021
    https://doi.org/10.3745/KTSDE.2021.10.9.375
    Keywords: Deep Learning, Coverage Testing, Image Feature Extraction, Validation Method, Dataset Splitting Method


    An Improvement Of Efficiency For kNN By Using A Heuristic
    Lee Jae Mun The KIPS Transactions:PartB , Vol. 10, No. 6, pp. 719-724, Oct. 2003
    10.3745/KIPSTB.2003.10.6.719


    MuGenFBD: Automated Mutant Generator for Function Block Diagram Programs
    Lingjun Liu, Eunkyoung Jee, Doo-Hwan Bae KIPS Transactions on Software and Data Engineering, Vol. 10, No. 4, pp. 115-124, Apr. 2021
    https://doi.org/10.3745/KTSDE.2021.10.4.115
    Keywords: Mutant Generation, Mutation Analysis, Function Block Diagram, Software Testing


    CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software
    Hyerin Leem, Hansol Choe, Hyorim Kim, Shin Hong KIPS Transactions on Software and Data Engineering, Vol. 9, No. 8, pp. 229-234, Aug. 2020
    https://doi.org/10.3745/KTSDE.2020.9.8.229
    Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing


    A Test Case Generation Method for Data Distribution System of Submarine
    Suik Son, Dongsu Kang KIPS Transactions on Software and Data Engineering, Vol. 8, No. 4, pp. 137-144, Apr. 2019
    https://doi.org/10.3745/KTSDE.2019.8.4.137
    Keywords: Data Distribution System, Model-based testing, Path Testing, Tree Traversal, test case generation


    Fault Injection Based Indirect Interaction Testing Approach for Embedded System
    Muhammad Iqbal Hossain, Woo Jin Lee KIPS Transactions on Software and Data Engineering, Vol. 6, No. 9, pp. 419-428, Sep. 2017
    10.3745/KTSDE.2017.6.9.419
    Keywords: Indirect Interaction, Interaction Testing, Test Case Generation, Fault Injection, Embedded System