Digital Library


Search: "[ keyword: Defect ]" (23)
    A Study of Analysis of Attribute and Operation based on COTS System
    Eun Ser Lee , Joong Soo Kim The KIPS Transactions:PartD, Vol. 17, No. 6, pp. 443-452, Dec. 2010
    10.3745/KIPSTD.2010.17.6.443


    LCD BLU Defects Detection System with Sidelight
    Chang Bae Moon , Jee Woong Bark , Hae Yeoun Lee , Byeong Man Kim , Yoon Sik Shin The KIPS Transactions:PartB , Vol. 17, No. 6, pp. 445-458, Dec. 2010
    10.3745/KIPSTB.2010.17.6.445


    Defect Detection and Defect Classification System for Ship Engine using Multi-Channel Vibration Sensor
    Yang Min Lee , Kwang Young Lee , Seung Hyun Bae , Hwi Jang , Jae Kee Lee The KIPS Transactions:PartA, Vol. 17, No. 2, pp. 81-92, Apr. 2010
    10.3745/KIPSTA.2010.17.2.81


    An Experimental Study of Generality of Software Defects Prediction Models based on Object Oriented Metrics
    Tae Yeon Kim , Yun Kyu Kim , Heung Seok Chae The KIPS Transactions:PartD, Vol. 16, No. 3, pp. 407-416, Jun. 2009
    10.3745/KIPSTD.2009.16.3.407


    A Study of Process Milestone for the Analysis of Risk Items
    Eun Ser Lee The KIPS Transactions:PartD, Vol. 16, No. 1, pp. 105-112, Feb. 2009
    10.3745/KIPSTD.2009.16.1.105


    A Study on Software Fault Analysis and Management Method using Defect Tracking System
    Young Joon Moon , Sung Yul Rhew The KIPS Transactions:PartD, Vol. 15, No. 3, pp. 321-326, Jun. 2008
    10.3745/KIPSTD.2008.15.3.321


    An Evaluation of Software Quality Using Phase-based Defect Profile
    Sang Un Lee The KIPS Transactions:PartD, Vol. 15, No. 3, pp. 313-320, Jun. 2008
    10.3745/KIPSTD.2008.15.3.313


    Study for Design of Defect Management to Improve the Quality of IoT Products
    Kim Jae Gyeong, Choi Yeong Sook, Cho Kyeong Rok, Lee Eun Ser KIPS Transactions on Software and Data Engineering, Vol. 11, No. 6, pp. 229-236, Jun. 2022
    https://doi.org/10.3745/KTSDE.2022.11.6.229
    Keywords: IoT, fire detection, Defect Management, Factor Analysis, Defect Tracking


    A Study on Tire Surface Defect Detection Method Using Depth Image
    Hyun Suk Kim, Dong Beom Ko, Won Gok Lee, You Suk Bae KIPS Transactions on Software and Data Engineering, Vol. 11, No. 5, pp. 211-220, May. 2022
    https://doi.org/10.3745/KTSDE.2022.11.5.211
    Keywords: Tire Defect Detection, Depth Image, Deep Learning, computer vision, image processing


    Design of Software Opportunity Tree and Its Algorithm Design to Defect Management
    Eun Ser Lee , Kyung Whan Lee The KIPS Transactions:PartD, Vol. 11, No. 4, pp. 873-884, Aug. 2004
    10.3745/KIPSTD.2004.11.4.873