Digital Library

Search: "[ author: 이은서 ]" (26)
    A Study of Analysis of Attribute and Operation based on COTS System
    Eun Ser Lee , Joong Soo Kim The KIPS Transactions:PartD, Vol. 17, No. 6, pp. 443-452, Dec. 2010
    10.3745/KIPSTD.2010.17.6.443


    Commonality and Variability Analysis Method for UML CASE Tool Frameworks
    Hwan Bok Choi , Eun Ser Lee , Yun Ho Kim The KIPS Transactions:PartD, Vol. 16, No. 6, pp. 927-934, Dec. 2009
    10.3745/KIPSTD.2009.16.6.927


    The VMDC(View, Model, Dispatcher, Controller) Architecture for Products Management
    Da Jeong Kim , Eun Ser Lee The KIPS Transactions:PartD, Vol. 16, No. 6, pp. 881-888, Dec. 2009
    10.3745/KIPSTD.2009.16.6.881


    A Study of Process Milestone for the Analysis of Risk Items
    Eun Ser Lee The KIPS Transactions:PartD, Vol. 16, No. 1, pp. 105-112, Feb. 2009
    10.3745/KIPSTD.2009.16.1.105


    A Study for Process Improvement by State Analysis of Risk Items
    Eun Ser Lee The KIPS Transactions:PartD, Vol. 15, No. 4, pp. 523-530, Aug. 2008
    10.3745/KIPSTD.2008.15.4.523


    A Study for Method of the User Authentication and Security apply to the Type of Function password in the Embedded System and Electronic Commerce
    Eun Ser Lee , Ho Young Moon , Sang Ho Lee The KIPS Transactions:PartD, Vol. 14, No. 4, pp. 363-372, Jun. 2007
    10.3745/KIPSTD.2007.14.4.363


    Opportunity Tree and Algorithm design to schedule management
    Eun Se Lee , Sang Ho Lee The KIPS Transactions:PartD, Vol. 12, No. 7, pp. 965-978, Dec. 2005
    10.3745/KIPSTD.2005.12.7.965


    Study for Design of Defect Management to Improve the Quality of IoT Products
    Kim Jae Gyeong, Choi Yeong Sook, Cho Kyeong Rok, Lee Eun Ser KIPS Transactions on Software and Data Engineering, Vol. 11, No. 6, pp. 229-236, Jun. 2022
    https://doi.org/10.3745/KTSDE.2022.11.6.229
    Keywords: IoT, fire detection, Defect Management, Factor Analysis, Defect Tracking


    Design of Software Opportunity Tree and Its Algorithm Design to Defect Management
    Eun Ser Lee , Kyung Whan Lee The KIPS Transactions:PartD, Vol. 11, No. 4, pp. 873-884, Aug. 2004
    10.3745/KIPSTD.2004.11.4.873


    A Study on the Design of a Test Item Framework for Securing Reliability of Laundry Home Appliances Using IoT Functions
    Cho Kyoung-Rok, Park Woo Jung, Lee Eun-Ser KIPS Transactions on Software and Data Engineering, Vol. 11, No. 2, pp. 67-80, Feb. 2022
    https://doi.org/10.3745/KTSDE.2022.11.2.67
    Keywords: IoT Function, Quality Assurance, Commonality, Variability, Importance, Priority, t-Test Statistics Analysis, evaluation


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