The Fastest Path Search and Defect Inspection of Type (sLa-pRc)


KIPS Transactions on Software and Data Engineering, Vol. 10, No. 10, pp. 385-390, Oct. 2021
https://doi.org/10.3745/KTSDE.2021.10.10.385,   PDF Download:
Keywords: SMT, SMD, Gantry, Moving Time, Vision Test
Abstract

The gantry is a device that moves fine chips from the feeder to the PCB. While the gantry is moving the part, the camera checks the condition of the part. The purpose of this paper is to find the path with the shortest travel time of the gantry and calculate the travel time according to the path. stop_motion is a way to check the status of the parts currently in use. This paper presents the moving_motion method and the fly_motion method with maximum speed in front of the camera. In addition the signature method was used to inspect the condition of the parts. When comparing the moving time of the three types of gantry, the moving_motion method improved by 9.42% and the fly_motion method by 17.73% compared to stop_motion. When the fly_motion method proposed in this paper is used for the gantry movement path, it is expected that productivity will be improved.


Statistics
Show / Hide Statistics

Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.


Cite this article
[IEEE Style]
K. S. Ho, L. E. Ser, K. C. Su, "The Fastest Path Search and Defect Inspection of Type (sLa-pRc)," KIPS Transactions on Software and Data Engineering, vol. 10, no. 10, pp. 385-390, 2021. DOI: https://doi.org/10.3745/KTSDE.2021.10.10.385.

[ACM Style]
Kim Soon Ho, Lee Eun Ser, and Kim Chi Su. 2021. The Fastest Path Search and Defect Inspection of Type (sLa-pRc). KIPS Transactions on Software and Data Engineering, 10, 10, (2021), 385-390. DOI: https://doi.org/10.3745/KTSDE.2021.10.10.385.