An On-The-Fly Testing Technique of Embedded Software using Aspect Components


The KIPS Transactions:PartD, Vol. 15, No. 6, pp. 785-792, Dec. 2008
10.3745/KIPSTD.2008.15.6.785,   PDF Download:

Abstract

In spite of the various techniques on the testing of embedded software, operation failures of embedded systems such as robot or satellite applications, are occurred frequently. The critical reason of these failures is due to the fact that software is embedded into a target system with inherent faults. Therefore, in order to prevent the failure owing to such faults, it needs a technique to test the embedded software which operates in real environment. In this paper, we propose a testing technique, aspect-based On-the-Fly testing that is to test the functionality and performance at real operation time. Our proposed technique gives some benefits of real test of unexpected input conditions, prevention of software malfunction, and reusability of aspect components for the testing.


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Cite this article
[IEEE Style]
J. P. Kim and J. E. Hong, "An On-The-Fly Testing Technique of Embedded Software using Aspect Components," The KIPS Transactions:PartD, vol. 15, no. 6, pp. 785-792, 2008. DOI: 10.3745/KIPSTD.2008.15.6.785.

[ACM Style]
Jong Phil Kim and Jang Eui Hong. 2008. An On-The-Fly Testing Technique of Embedded Software using Aspect Components. The KIPS Transactions:PartD, 15, 6, (2008), 785-792. DOI: 10.3745/KIPSTD.2008.15.6.785.