Method for Improving Description of Software Metrics Using Metric Description Language Based on OCL
The KIPS Transactions:PartD, Vol. 15, No. 5, pp. 629-646, Oct. 2008
10.3745/KIPSTD.2008.15.5.629, PDF Download:
Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
T. Y. Kim, Y. K. Kim, H. S. Chae, "Method for Improving Description of Software Metrics Using Metric Description Language Based on OCL," The KIPS Transactions:PartD, vol. 15, no. 5, pp. 629-646, 2008. DOI: 10.3745/KIPSTD.2008.15.5.629.
[ACM Style]
Tae Yeon Kim, Yun Kyu Kim, and Heung Seok Chae. 2008. Method for Improving Description of Software Metrics Using Metric Description Language Based on OCL. The KIPS Transactions:PartD, 15, 5, (2008), 629-646. DOI: 10.3745/KIPSTD.2008.15.5.629.