A Study on Software Fault Analysis and Management Method using Defect Tracking System


The KIPS Transactions:PartD, Vol. 15, No. 3, pp. 321-326, Jun. 2008
10.3745/KIPSTD.2008.15.3.321,   PDF Download:

Abstract

The software defects that are not found in the course of a project frequently appear during the conduct of the maintenance procedure after the complete development of the software. As the frequency of surfacing of defects during the maintenance procedure increases, the cost likewise increases, and the quality and customer reliability decreases. The defect rate will go down only if cause analysis and process improvement are constantly performed. This study embodies the defect tracking system (DTS) by considering the Pareto principle: that most defects are repetitions of defects that have previously occurred. Based on the records of previously occurring defects found during the conduct of a maintenance procedure, DTS tracks the causes of the software defects and provides the developer, operator, and maintenance engineer with the basic data for the improvement of the software concerned so that the defect will no longer be manifested or repeated. The basic function of DTS is to analyze the defect type, provide the measurement index for it, and aggregate the program defect type. Doing these will pave the way for the full correction of all the defects of a software as it will enable the defect correction team to check the measured defect type. When DTS was applied in the software configuration management system of the W company, around 65% of all its software defects were corrected.


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Cite this article
[IEEE Style]
Y. J. Moon and S. Y. Rhew, "A Study on Software Fault Analysis and Management Method using Defect Tracking System," The KIPS Transactions:PartD, vol. 15, no. 3, pp. 321-326, 2008. DOI: 10.3745/KIPSTD.2008.15.3.321.

[ACM Style]
Young Joon Moon and Sung Yul Rhew. 2008. A Study on Software Fault Analysis and Management Method using Defect Tracking System. The KIPS Transactions:PartD, 15, 3, (2008), 321-326. DOI: 10.3745/KIPSTD.2008.15.3.321.