Reengineering Black-box Test Cases
The KIPS Transactions:PartD, Vol. 13, No. 4, pp. 573-582, Aug. 2006
10.3745/KIPSTD.2006.13.4.573, PDF Download:
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Cite this article
[IEEE Style]
K. I. Seo and E. M. Choi, "Reengineering Black-box Test Cases," The KIPS Transactions:PartD, vol. 13, no. 4, pp. 573-582, 2006. DOI: 10.3745/KIPSTD.2006.13.4.573.
[ACM Style]
Kwang Ik Seo and Eun Man Choi. 2006. Reengineering Black-box Test Cases. The KIPS Transactions:PartD, 13, 4, (2006), 573-582. DOI: 10.3745/KIPSTD.2006.13.4.573.