Test Case Generation for Conformance Test of DSM-CC U-U
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 6, No. 8, pp. 2171-2178, Aug. 1999
10.3745/KIPSTE.1999.6.8.2171, PDF Download:
Abstract
Statistics
Show / Hide Statistics
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
K. Y. Gyu, L. O. Bin, K. H. Suh, K. Y. Duk, L. S. Ho, "Test Case Generation for Conformance Test of DSM-CC U-U," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 6, no. 8, pp. 2171-2178, 1999. DOI: 10.3745/KIPSTE.1999.6.8.2171.
[ACM Style]
Kim Young Gyu, Lee Ok Bin, Kim Hak Suh, Kwon Young Duk, and Lee Sang Ho. 1999. Test Case Generation for Conformance Test of DSM-CC U-U. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 6, 8, (1999), 2171-2178. DOI: 10.3745/KIPSTE.1999.6.8.2171.