Computer Graphics & Delay Fault Test Pattern Generator Using Indirect Implication Algorithms in Scan Environment
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 6, No. 6, pp. 1656-1666, Jun. 1999
10.3745/KIPSTE.1999.6.6.1656, PDF Download:
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Cite this article
[IEEE Style]
K. W. Gi, K. M. Gyun, K. S. Ho, "Computer Graphics & Delay Fault Test Pattern Generator Using Indirect Implication Algorithms in Scan Environment," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 6, no. 6, pp. 1656-1666, 1999. DOI: 10.3745/KIPSTE.1999.6.6.1656.
[ACM Style]
Kim Won Gi, Kim Myoung Gyun, and Kang Sung Ho. 1999. Computer Graphics & Delay Fault Test Pattern Generator Using Indirect Implication Algorithms in Scan Environment. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 6, 6, (1999), 1656-1666. DOI: 10.3745/KIPSTE.1999.6.6.1656.