Kim Kyu Chull

The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 5, No. 11, pp. 2989-2996, Nov. 1998
10.3745/KIPSTE.1998.5.11.2989,   PDF Download:

Abstract

As the circuit density of VLSI grows and its performance improves, delay fault testing of VLSI becomes very important. Delay faults in a circuit can be categorized into two classes, gate delay faults and path delay faults. This paper proposed two methods in dynamic memory usage in the path delay fault simulation. The first method is similar to that used in concurrent fault simulation for stuck-at faults and the second method reduces dynamic memory usage by not inserting a fault descriptor into the fault list when its value is X. The second method, called Implicit-X method, showed superior performance in both dynamic memory usage and simulation time than the first method, called Concurrent-Simulation-Like method.

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