The Inspection Algorithm using Invariant Moment for the Detection of Lead Faults of Semiconductor IC


The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 5, No. 10, pp. 2737-2749, Oct. 1998
10.3745/KIPSTE.1998.5.10.2737,   PDF Download:

Abstract

Recently, vision system is widely used in factory automation processes. In this paper, the method which detects the badness in the position, slop, and the lead of chips is proposed for the inspection of semiconductor chips. The conventional methods mainly inspect semiconductor IC with the features which is extracted in image. But we propose the method which segments the lead part by the morphology and inspects the lead faults by the invariant moment. In the simulation, the results of the proposed method is better than those of the conventional method for the noisy and noiseless images.


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Cite this article
[IEEE Style]
R. K. Whi and K. J. Seek, "The Inspection Algorithm using Invariant Moment for the Detection of Lead Faults of Semiconductor IC," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 5, no. 10, pp. 2737-2749, 1998. DOI: 10.3745/KIPSTE.1998.5.10.2737.

[ACM Style]
Rhee Kil Whi and Kim Joon Seek. 1998. The Inspection Algorithm using Invariant Moment for the Detection of Lead Faults of Semiconductor IC. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 5, 10, (1998), 2737-2749. DOI: 10.3745/KIPSTE.1998.5.10.2737.