The Inspection Algorithm using Invariant Moment for the Detection of Lead Faults of Semiconductor IC
The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 5, No. 10, pp. 2737-2749, Oct. 1998
10.3745/KIPSTE.1998.5.10.2737, PDF Download:
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Cite this article
[IEEE Style]
R. K. Whi and K. J. Seek, "The Inspection Algorithm using Invariant Moment for the Detection of Lead Faults of Semiconductor IC," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 5, no. 10, pp. 2737-2749, 1998. DOI: 10.3745/KIPSTE.1998.5.10.2737.
[ACM Style]
Rhee Kil Whi and Kim Joon Seek. 1998. The Inspection Algorithm using Invariant Moment for the Detection of Lead Faults of Semiconductor IC. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 5, 10, (1998), 2737-2749. DOI: 10.3745/KIPSTE.1998.5.10.2737.