Software Reliability Growth Modeling in the Testing Phase with an Outlier Stage


The Transactions of the Korea Information Processing Society (1994 ~ 2000), Vol. 5, No. 10, pp. 2575-2583, Oct. 1998
10.3745/KIPSTE.1998.5.10.2575,   PDF Download:

Abstract

The production of the highly reliable software systems and theirs performance evaluation have become important interests in the software industry. The software evaluation has been mainly carried out in terms of both reliability and performance of software system. Software reliability is the probability that no software error occurs for a fixed time interval during software testing phase. These theoretical software reliability models are sometimes unsuitable for the practical testing phase in which a software error at a certain testing stage occurs by causes of the imperfect debugging, abnormal software correction, and so on. Such a certain software testing stage needs to be considered as an outlying stage. And we can assume that the software reliability does not improve by means of nuisance factor in this outlying testing stage. In this paper, we discuss Bavesian software reliability growth modeling and estimation procedure in the presence of an unidentified outlying software testing stage by the modification of Jelinski-Moranda. Also we derive the Bayes estimators of the software reliability parameters by the assumption of prior information under the squared error loss function. In addition, we evaluate the proposed software reliability growth model with an unidentified outlying stage in an exchangeable outlier model according to the values of nuisance parameter using the accuracy, bias, trend, noise, metrics as the quantitative evaluation criteria through the computer simulation.


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Cite this article
[IEEE Style]
P. M. Gon and J. E. Yi, "Software Reliability Growth Modeling in the Testing Phase with an Outlier Stage," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 5, no. 10, pp. 2575-2583, 1998. DOI: 10.3745/KIPSTE.1998.5.10.2575.

[ACM Style]
Park Man Gon and Jung Eun Yi. 1998. Software Reliability Growth Modeling in the Testing Phase with an Outlier Stage. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 5, 10, (1998), 2575-2583. DOI: 10.3745/KIPSTE.1998.5.10.2575.