Digital Library


Search: "[ author: Jihyun Lee ]" (2)
    Code Coverage Measurement in Configurable Software Product Line Testing
    Soobin Han, Jihyun Lee, Seoyeon Go KIPS Transactions on Software and Data Engineering, Vol. 11, No. 7, pp. 273-282, Jul. 2022
    https://doi.org/10.3745/KTSDE.2022.11.7.273
    Keywords: Configurable Software Product Line, Software Product Line Testing, Test Coverage Measurement, Code Coverage


    A Dynamically Segmented DCT Technique for Grid Artifact Suppression in X-ray Images
    Hyunggue Kim, Joongeun Jung, Jihyun Lee, Joonhyuk Park, Jisu Seo, Hojoon Kim KIPS Transactions on Software and Data Engineering, Vol. 8, No. 4, pp. 171-178, Apr. 2019
    https://doi.org/10.3745/KTSDE.2019.8.4.171
    Keywords: Radiography, Medical Image Processing, Grid Artifacts, Blocking Effect, Discrete Cosine Transform