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LCD BLU Defects Detection System with Sidelight
Chang Bae Moon , Jee Woong Bark , Hae Yeoun Lee , Byeong Man Kim , Yoon Sik Shin KIPS Transactions on Software and Data Engineering,
Vol. 17, No. 6, pp. 445-458,
Jun.
2010
10.3745/KIPSTB.2010.17.6.445
10.3745/KIPSTB.2010.17.6.445
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Vol. 9, 2020
- Vol. 9, No. 12 (Dec. 2020)
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Vol. 8, 2019
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Vol. 7, 2018
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Vol. 6, 2017
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Vol. 5, 2016
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Vol. 4, 2015
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Vol. 3, 2014
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Vol. 2, 2013
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Vol. 1, 2012
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