A Fast Way for Alignment Marker Detection and Position Calibration


KIPS Transactions on Software and Data Engineering, Vol. 5, No. 1, pp. 35-42, Jan. 2016
10.3745/KTSDE.2016.5.1.35, Full Text:

Abstract

The core of the machine vision that is frequently used at the pre/post-production stages is a marker alignment technology. In this paper, a method to detect the angle and position of a product at high speed by use of a unique pattern present in the marker stamped on the product, and calibrate them is proposed. In the proposed method, to determine the angle and position of a marker, the candidates of the marker are extracted by using a variation of the integral histogram, and then clustering is applied to reduce the candidates. The experimental results revealed about 5s 719ms improvement in processing time and better precision in detecting the rotation angle of a product.


Statistics
Show / Hide Statistics

Statistics (Cumulative Counts from September 1st, 2017)
Multiple requests among the same browser session are counted as one view.
If you mouse over a chart, the values of data points will be shown.


Cite this article
[IEEE Style]
C. B. Moon, H. S. Kim, H. Y. Kim, D. W. Lee, T. H. Kim, H. Chung and B. M. Kim, "A Fast Way for Alignment Marker Detection and Position Calibration," KIPS Transactions on Software and Data Engineering, vol. 5, no. 1, pp. 35-42, 2016. DOI: 10.3745/KTSDE.2016.5.1.35.

[ACM Style]
Chang Bae Moon, Hyun Soo Kim, Hyun Yong Kim, Dong Won Lee, Tae Hoon Kim, Hae Chung, and Byeong Man Kim. 2016. A Fast Way for Alignment Marker Detection and Position Calibration. KIPS Transactions on Software and Data Engineering, 5, 1, (2016), 35-42. DOI: 10.3745/KTSDE.2016.5.1.35.